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Yonehara T et al. – The calibration curves of V, Cr, Mn, and Ni measured for standard steel materials showed good linear relationships. Clear elemental mapping could be obtained by scanning the sample. An elemental analysis of a micro–region in an electronic device was also performed by the transportable micro–XRF spectrometer. Sn and Pb were detected at the metallic part of the device. Br and Ba were observed at some resin parts of the electronic device.


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